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Atomic structure of a (2 x 1) reconstructed NiSi2/Si(001) interface.

作者信息

Falke Uwe, Bleloch Andrew, Falke Meiken, Teichert Steffen

机构信息

UK SuperSTEM, Daresbury Laboratory, Daresbury WA4 4AD, United Kingdom.

出版信息

Phys Rev Lett. 2004 Mar 19;92(11):116103. doi: 10.1103/PhysRevLett.92.116103.

DOI:10.1103/PhysRevLett.92.116103
PMID:15089154
Abstract

Nickel disilicide/silicon (001) interfaces were investigated by aberration corrected scanning transmission electron microscopy (STEM). The atomic structure was derived directly from the high spatial resolution high angle annular dark field STEM images without recourse to image simulation. It comprises fivefold coordinated silicon and sevenfold coordinated nickel sites at the interface and shows a 2 x 1 reconstruction. The proposed structure has not been experimentally observed before but has been recently predicted theoretically by others to be energetically favored.

摘要

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