Folwaczny Matthias, Heym Richard, Mehl Albert, Hickel Reinhard
Department of Operative Dentistry and Periodontology, Ludwig-Maximilians University, Munich, Germany.
J Periodontol. 2004 May;75(5):744-9. doi: 10.1902/jop.2004.75.5.744.
The aim of the present study was to compare the ability of the diode laser to detect residual calculus with that of an explorer.
The root surface of 40 extracted human teeth, each partially covered with subgingival calculus, was instrumented with curets under simulated clinical conditions in a manikin. The samples were randomly assigned to two study groups. In group A, the root surface was treated with an explorer until it appeared free of mineralized deposits upon examination. The samples in group B were instrumented until the relative intensity of fluorescence as induced with diode laser radiation was below a threshold value of 5. The root surface of each sample was then examined for residual calculus using standardized digital images. The statistical analysis was performed with a non-paired t test at a level of significance of 5% (P < 0.05).
The root surface of single-rooted teeth showed residual calculus on 0.19 +/- 0.37 x 10(7) microm2 in the laser group and on 0.11 +/- 0.26 x 10(7) microm2 in the explorer group (P = 0.19). For multirooted teeth, the mean calculus-covered area was 0.50 +/- 0.48 x 10(7) microm2 for the teeth evaluated with an explorer and 0.27 +/- 0.43 x 10(7) microm2 for the diode laser group (P = 0.02).
The present findings indicate that the detection of subgingival calculus is significantly improved using 655 nm diode laser radiation compared to an explorer for molars but not for single-rooted teeth.
本研究的目的是比较二极管激光与探针检测残留牙石的能力。
在模拟临床条件下，使用人体模型对40颗拔除的人牙的牙根表面进行处理，每颗牙的牙根表面均部分覆盖有龈下牙石。将样本随机分为两个研究组。在A组中，用探针处理牙根表面，直至检查时表面无矿化沉积物。B组的样本进行处理，直到二极管激光辐射诱导的荧光相对强度低于阈值5。然后使用标准化数字图像检查每个样本的牙根表面是否存在残留牙石。采用非配对t检验进行统计学分析，显著性水平为5%（P < 0.05）。
单根牙的牙根表面，激光组残留牙石面积为0.19 +/- 0.37 x 10(7) 平方微米，探针组为0.11 +/- 0.26 x 10(7) 平方微米（P = 0.19）。对于多根牙，用探针评估的牙齿平均牙石覆盖面积为0.50 +/- 0.48 x 10(7) 平方微米，二极管激光组为0.27 +/- 0.43 x 10(7) 平方微米（P = 0.02）。
目前的研究结果表明，与探针相比，使用655 nm二极管激光辐射检测龈下牙石，对于磨牙有显著改善，但对于单根牙则不然。
