Mana Giovanni, Palmisano Carlo
CNR-Istituto di Metrologia 'G. Colonnetti', str. delle cacce 73, 10135 Torino, Italy.
Acta Crystallogr A. 2004 Jul;60(Pt 4):283-93. doi: 10.1107/S0108767304009420. Epub 2004 Jun 24.
X-ray diffraction in continuously deformed crystals is considered by application of Fourier optics and from the viewpoint of the analogy between X-ray dynamics and the motion of two-level systems in quantum mechanics. Different forms of Takagi's equations are traced back to a common framework and it is shown that they are different ways to represent the same propagation equation. A novel way to solve Takagi's equations in the presence of a constant strain gradient is presented and approximation methods derived from quantum mechanics are considered. Crystal deformation in X-ray interferometry and two-crystal spectrometry are discussed and it is demonstrated that Si lattice-parameter measurements depend on the diffracting plane spacing on the crystal surface.
通过应用傅里叶光学,并从X射线动力学与量子力学中两能级系统运动的类比角度,对连续变形晶体中的X射线衍射进行了研究。高桥方程的不同形式可追溯到一个共同的框架,结果表明它们是表示同一传播方程的不同方式。提出了一种在存在恒定应变梯度的情况下求解高桥方程的新方法,并考虑了源自量子力学的近似方法。讨论了X射线干涉测量法和双晶光谱法中的晶体变形,结果表明硅晶格参数测量取决于晶体表面的衍射平面间距。