双色双光子4π荧光显微镜

Two-color two-photon 4Pi fluorescence microscopy.

作者信息

Chen Jianfang, Midorikawa Katsumi

机构信息

Laser Technology Laboratory, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198, Japan.

出版信息

Opt Lett. 2004 Jun 15;29(12):1354-6. doi: 10.1364/ol.29.001354.

Abstract

In 4Pi fluorescence microscopy the point-spread function is composed of a strong central lobe accompanied by interference sidelobes that produce artifacts in the image. We propose to combine two-color two-photon fluorescence microscopy and 4Pi fluorescence microscopy to overcome this sidelobe problem. Simulation results show that a single sharp fluorescence spot can be produced by use of two excitation wavelengths of 400 and 800 nm and detected at 350-nm emission wavelength.

摘要

在4π荧光显微镜中,点扩散函数由一个强中心瓣以及干扰旁瓣组成,这些旁瓣会在图像中产生伪像。我们建议将双色双光子荧光显微镜和4π荧光显微镜相结合,以克服这个旁瓣问题。模拟结果表明,通过使用400和800 nm的两个激发波长,并在350 nm发射波长下进行检测,可以产生单个尖锐的荧光点。

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