Chen Gang-Jin, Xiao Hui-Ming, Zhu Chun-Feng
Institute of Functional Material Research, Zhejiang University of Science and Technology, Hangzhou 310027, China.
J Zhejiang Univ Sci. 2004 Aug;5(8):923-7. doi: 10.1007/BF02947599.
In this work, the charge dynamics characteristics of injection, transport and decay in porous and non-porous polytetrafluoroethylene (PTFE) film electrets were investigated by means of corona charging, isothermal and thermal stimulating surface-potential decay measurements. The results showed that the initial surface potential, whether positively or negatively charging, is much higher in non-porous PTFE than in porous PTFE. For porous film the value of initial surface potentials increases with increase of film thickness. Higher charging temperature can remarkably improve charge stability. The charge dynamics are correlated to materials microstructure according to their scanning electron micrographs. For non-porous PTFE films, polarizability change of C-F bonds is the main origin of electret charges; but for porous PTFE film a large number of bulk and interface type traps are expected because of the greater area of interface and higher crystallinity.
在这项工作中,通过电晕充电、等温及热刺激表面电位衰减测量,研究了多孔和无孔聚四氟乙烯(PTFE)薄膜驻极体中注入、传输和衰减的电荷动力学特性。结果表明,无论是正电荷还是负电荷充电,无孔PTFE的初始表面电位都比多孔PTFE高得多。对于多孔薄膜,初始表面电位值随薄膜厚度的增加而增加。较高的充电温度可显著提高电荷稳定性。根据扫描电子显微镜图像,电荷动力学与材料微观结构相关。对于无孔PTFE薄膜,C-F键的极化率变化是驻极体电荷的主要来源;但对于多孔PTFE薄膜,由于界面面积更大和结晶度更高,预计会有大量的体陷阱和界面型陷阱。