Kalinin Anton, Kornilov Oleg, Rusin Lev Yu, Toennies J Peter
Max-Planck-Institut fur Stromungsforschung, 37073 Gottingen, Germany.
J Chem Phys. 2004 Jul 8;121(2):625-7. doi: 10.1063/1.1768935.
The HeH2 van der Waals complex has been identified in a molecular beam produced by a cryogenic (T0=24.7 K) free jet expansion of a 1% H2 mixture in 99% 4He gas. The weakly bound HeH2 complexes in the beam are identified via their first order diffraction angles after passing through a 100 nm period transmission grating. An electron impact mass spectrometer analysis of the diffraction patterns is used to discriminate against ion fragments of the constituent gas clusters.
在由99%的4He气体中1%的H2混合物进行低温（T0 = 24.7 K）自由射流膨胀产生的分子束中，已鉴定出HeH2范德华复合物。通过让分子束中的弱束缚HeH2复合物穿过一个100纳米周期的透射光栅，根据其一阶衍射角来识别它们。利用对衍射图样的电子碰撞质谱分析来区分组成气体团簇的离子碎片。
