van der Valk N C J, Planken P C M
University of Technology Delft, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
Philos Trans A Math Phys Eng Sci. 2004 Feb 15;362(1815):315-9; discussion 319-21. doi: 10.1098/rsta.2003.1316.
We have detected sub-wavelength spot sizes in the near-field of a metal tip, which is illuminated with terahertz (THz) pulses. The THz near-field is detected by using electro-optic detection in a (100) oriented GaP crystal. Contrary to conventional electro-optic detection, which uses (110) oriented detection crystals, (100) crystals only allow the detection of THz light, polarized perpendicular to our crystal surface. This component is strongly localized near the apex of the tip, which has sub-wavelength dimensions. The detection process is blind to the incident THz radiation, which is polarized parallel to the crystal surface. As a result, a sub-wavelength THz spot size with an intensity full-width half maximum (FWHM) diameter of lambda/200 is observed.
我们已在由太赫兹(THz)脉冲照射的金属尖端近场中检测到亚波长光斑尺寸。通过在(100)取向的GaP晶体中使用电光检测来检测太赫兹近场。与使用(110)取向检测晶体的传统电光检测相反,(100)晶体仅允许检测垂直于我们晶体表面偏振的太赫兹光。该分量强烈地局域在具有亚波长尺寸的尖端顶点附近。检测过程对平行于晶体表面偏振的入射太赫兹辐射不敏感。结果,观察到强度半高宽(FWHM)直径为λ/200的亚波长太赫兹光斑尺寸。