THz emission microscopy with sub-wavelength broadband source.

作者信息

Lecaque Romain, Grésillon Samuel, Boccara Claude

机构信息

Laboratoire Photons Et Matière, UPR5 CNRS and University P. et M. Curie-ESPCI, 10 rue Vauquelin 75231, Paris Cedex 05, France.

出版信息

Opt Express. 2008 Mar 31;16(7):4731-8. doi: 10.1364/oe.16.004731.

DOI:10.1364/oe.16.004731

PMID:18542570

Abstract

A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than lambda/10. The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.

摘要