Yokoyama Shuko, Nakamura Ryotaro, Nose Masaki, Araki Tsutomu, Yasui Takeshi
Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan.
Opt Express. 2008 Aug 18;16(17):13052-61. doi: 10.1364/oe.16.013052.
Precision frequency measurements of terahertz (THz) waves are required to establish metrology in the THz spectral region. However, frequency measurement techniques in this region are immature. We propose a THz spectrum analyzer to measure the absolute frequency and spectral shape of continuous-wave THz waves. Based on a stable frequency comb generated in a photoconductive antenna, the absolute frequency of a sub- THz test source was determined at a precision of 2.8 x 10(-11). Furthermore, the spectral bandwidth of the THz spectrum analyzer can be extended over 1 THz, as demonstrated by measurement of a THz test source. This spectrum analyzer has the potential to become a powerful tool for THz frequency metrology.