Kirkland Angus I, Meyer Rüdiger R
University of Oxford, Department of Materials, Parks Road, Oxford OX1 3PH, UK.
Microsc Microanal. 2004 Aug;10(4):401-13. doi: 10.1017/S1431927604040437.
Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave function and can extend the interpretable resolution. However, such reconstructions require the a posteriori determination of the objective lens aberrations, including the actual beam tilt, defocus, and twofold and threefold astigmatism. In this review, we outline the theory behind exit plane wavefunction reconstruction and describe methods for the accurate and automated determination of the required coefficients of the wave aberration function. Finally, recent applications of indirect reconstruction in the structural analysis of complex oxides are presented.
仪器设备和图像处理技术的改进意味着，涉及聚焦或束倾斜系列图像重建的方法如今正在兑现它们长期以来所展现的前景。这种间接方法可恢复样品出射平面波函数的相位和模量，并能扩展可解释的分辨率。然而，此类重建需要对物镜像差进行后验确定，包括实际的束倾斜、散焦以及二次和三次像散。在本综述中，我们概述了出射平面波函数重建背后的理论，并描述了准确且自动确定波像差函数所需系数的方法。最后，介绍了间接重建在复杂氧化物结构分析中的最新应用。
