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异质外延中岛状形成的表观临界厚度的起源。

Origin of apparent critical thickness for island formation in heteroepitaxy.

作者信息

Tu Yuhai, Tersoff J

机构信息

IBM Research Division, T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, USA.

出版信息

Phys Rev Lett. 2004 Nov 19;93(21):216101. doi: 10.1103/PhysRevLett.93.216101. Epub 2004 Nov 16.

Abstract

We find that a continuum model of heteroepitaxy exhibits a sharp crossover with increasing coverage, from planar growth to island formation. The "critical thickness" at which this Stranski-Krastanov transition occurs depends sensitively on misfit strain, with a dependence strikingly similar to that seen experimentally. The initial planar growth occurs because of intermixing of deposited material with the substrate. While the transition is strictly kinetic in nature, it depends only weakly on growth rate. The role of surface segregation is also discussed.

摘要

我们发现,异质外延的连续介质模型随着覆盖度的增加呈现出从平面生长到岛状形成的急剧转变。发生这种斯特兰斯基-克拉斯坦诺夫转变的“临界厚度”敏感地依赖于失配应变,其依赖性与实验观察到的极为相似。最初的平面生长是由于沉积材料与衬底的混合。虽然这种转变本质上严格是动力学的,但它仅微弱地依赖于生长速率。还讨论了表面偏析的作用。

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