Fähnle M, Albrecht J, Eimüller T, Fischer P, Goering E, Steiauf D, Schütz G
Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
J Synchrotron Radiat. 2005 Mar;12(Pt 2):251-3. doi: 10.1107/S0909049504028936. Epub 2005 Feb 22.
A new method is proposed for the imaging of the flux-line lattice of a type-II superconductor by soft X-ray absorption microscopy. It is shown that the method is very demanding but probably realisable in the foreseeable future. The new method has the potential to image in real space static and dynamical properties of the flux-line lattice at arbitrary external fields and with single-flux-line resolution.
提出了一种通过软X射线吸收显微镜对II型超导体磁通线晶格进行成像的新方法。结果表明，该方法要求很高，但在可预见的未来可能实现。这种新方法有可能在实空间中对任意外场下磁通线晶格的静态和动态特性进行成像，且具有单磁通线分辨率。
