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Calculating the exclusion probability and paternity index for X-chromosomal loci in the presence of substructure.

作者信息

Ayres Karen L, Powley William M

机构信息

School of Applied Statistics, University of Reading, P.O. Box 240, Reading, RG6 6FN, UK.

出版信息

Forensic Sci Int. 2005 May 10;149(2-3):201-3. doi: 10.1016/j.forsciint.2004.06.017.

DOI:10.1016/j.forsciint.2004.06.017
PMID:15749362
Abstract

There has been recent interest in the use of X-chromosomal loci for forensic and relatedness testing casework, with many authors developing new X-linked short tandem repeat (STR) loci suitable for forensic use. Here we present formulae for two key quantities in paternity testing, the average probability of exclusion and the paternity index, which are suitable for X-chromosomal loci in the presence of population substructure.

摘要

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