Ajo-Franklin Caroline M, Yoshina-Ishii Chiaki, Boxer Steven G
Department of Chemistry, Stanford University, Stanford, California 94305-5080, USA.
Langmuir. 2005 May 24;21(11):4976-83. doi: 10.1021/la0468388.
Fluorescence interference contrast microscopy (FLIC) is a powerful method to structurally characterize fluorescent objects with nanometer-scale resolution in the z direction. Here we use FLIC to characterize the water layer underlying supported membranes and membrane-tethered double-stranded oligonucleotides. FLIC measurements of supported membranes containing the lipid-anchored fluorescent dye DiI in both leaflets indicate the thickness of the water layer separating the solid support and the lower lipid leaflet is 1.3 +/- 0.2 nm. Addition of cobalt(II) chloride to a DiI-supported membrane quenches the fluorescence in the top leaflet of the supported membrane; FLIC measurements of this system precisely locate the DiI to the bottom leaflet. These experiments confirm the accuracy of the model and parameters used to determine the water layer thickness, demonstrate the ability to differentiate between fluorescent objects whose average position differs by approximately 1.9 nm, and provide a widely applicable method to test the resolution of other high-z-resolution fluorescent microscopies. FLIC measurements of Alexa-labeled double-stranded oligonucleotides tethered to a supported membrane indicate that the DNA double helix is oriented perpendicular to the surface. Complications that arise from uncertainly in the orientation of the fluorophore are discussed. Several improvements in FLIC methodology are described. These stringent tests of the resolution of FLIC and the ability to unambiguously determine fluorescent lipid distribution provide structural insight on assemblies at membrane interfaces and permit the detection of even subtle changes at such interfaces.
荧光干涉对比显微镜(FLIC)是一种强大的方法,可在z方向上以纳米级分辨率对荧光物体进行结构表征。在这里,我们使用FLIC来表征支撑膜和膜拴系双链寡核苷酸下方的水层。对在两个小叶中均含有脂质锚定荧光染料DiI的支撑膜进行FLIC测量表明,分隔固体支撑物和下层脂质小叶的水层厚度为1.3±0.2纳米。向DiI支撑膜中添加氯化钴(II)可淬灭支撑膜顶部小叶中的荧光;对该系统进行FLIC测量可将DiI精确定位到底部小叶。这些实验证实了用于确定水层厚度的模型和参数的准确性,证明了区分平均位置相差约1.9纳米的荧光物体的能力,并提供了一种广泛适用的方法来测试其他高z分辨率荧光显微镜的分辨率。对拴系在支撑膜上的Alexa标记双链寡核苷酸进行FLIC测量表明,DNA双螺旋垂直于表面定向。讨论了由于荧光团方向不确定而产生的复杂性。描述了FLIC方法的一些改进。这些对FLIC分辨率和明确确定荧光脂质分布能力的严格测试提供了对膜界面组装体的结构洞察,并允许检测此类界面处甚至细微的变化。