Jacobsen Volker, Tätte Tanel, Branscheid Robert, Mäeorg Uno, Saal Kristjan, Kink Ilmar, Lõhmus Ants, Kreiter Maximilian
Max Planck Institute for Polymer Research, D-55021 Mainz, Germany.
Ultramicroscopy. 2005 Aug;104(1):39-45. doi: 10.1016/j.ultramic.2005.02.006. Epub 2005 Apr 7.
We demonstrate that an optically transparent and electrically conductive antimon-doped tin-oxide tip that is prepared in a sol-gel process can be used as a probe for scanning tunnelling microscopy (STM), yielding atomic vertical and nanometre lateral resolution. Emission of visible light from the tunnelling junction between gold particles and the tip is observed for bias voltages above 7 V. In contrast to the metallic tips generally used in STM, this tip does not significantly perturb the local optical response. Therefore, the tunnelling induced light can be used to map the optical near-field of surface structures with the tunnel gap acting as highly localised light source for the investigation of near-field enhancement in complex metal structures.
我们证明，通过溶胶-凝胶法制备的光学透明且导电的锑掺杂氧化锡尖端可作为扫描隧道显微镜（STM）的探针，产生原子级垂直分辨率和纳米级横向分辨率。对于高于7 V的偏置电压，观察到金颗粒与尖端之间的隧道结发出可见光。与STM中通常使用的金属尖端不同，这种尖端不会显著干扰局部光学响应。因此，隧道诱导光可用于绘制表面结构的光学近场，其中隧道间隙充当高度局部化的光源，用于研究复杂金属结构中的近场增强。
