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发射模式扫描近场光学显微镜中探针的耦合效率

Coupling efficiency of probes in emission-mode scanning near-field optical microscopy.

作者信息

Alvarez L, Xiao M

机构信息

Instituto de Ingeniería, Universidad Autónoma de Baja California, Blvd. Benito Juárez esq. Calle de la Normal, Col. Insurgentes Este, CP 21280, Mexicali, Baja California, México.

出版信息

J Microsc. 2008 Feb;229(Pt 2):371-6. doi: 10.1111/j.1365-2818.2008.01914.x.

Abstract

In scanning near-field optical microscopy, a tapered fibre tip scans above the sample surface at nanometric distances. The fibre tip can be used either as a detector to receive the near-field signal or as the light source to illuminate the sample or simultaneously for both purposes. When used as an emitter of light, the scanning near-field optical microscopy is said to function in emission mode. In such emission mode, the light emitted by the probe interacts with the microscopic features on the sample surface, and the result of this interaction is focussed by means of a conventional microscope. In our present work, we concentrate on how the light is emitted from the fibre tip. The power emitted by the probe is critical because it is directly related to the power that reaches the detector and in turn to the resolution of the instrument. A typical probe is made of a tapered optical fibre coated with metal. For probes fabricated by etching, the taper angle is high and the radii of the core and cladding are constant. Thus, the probe can be crudely approximated by a circular aperture on top of a metal-coated optical fibre end. It is interesting to study how the dielectric waveguide modes will couple into the metallic waveguide modes. In this work, a single mode excited in the dielectric waveguide is assumed, and calculations of the power transmitted through the aperture are carried out. A comparison between the power transmitted by different optical fibre modes and different optical fibre parameters is conducted, and the implications for the coupling efficiency of emission-mode fibre tips are discussed.

摘要

在扫描近场光学显微镜中,一个锥形光纤尖端在样品表面上方以纳米级距离进行扫描。该光纤尖端既可以用作探测器来接收近场信号,也可以用作光源来照亮样品,或者同时用于这两个目的。当用作发光体时,扫描近场光学显微镜被称为在发射模式下工作。在这种发射模式下,探针发出的光与样品表面的微观特征相互作用,这种相互作用的结果通过传统显微镜进行聚焦。在我们目前的工作中,我们关注的是光如何从光纤尖端发射出来。探针发射的功率至关重要,因为它直接关系到到达探测器的功率,进而关系到仪器的分辨率。典型的探针由涂有金属的锥形光纤制成。对于通过蚀刻制造的探针,锥角较大,纤芯和包层的半径是恒定的。因此,该探针可以粗略地近似为金属涂覆光纤端部顶部的一个圆形孔径。研究介质波导模式如何耦合到金属波导模式是很有趣的。在这项工作中,假设在介质波导中激发了单模,并对通过孔径传输的功率进行了计算。对不同光纤模式和不同光纤参数传输的功率进行了比较,并讨论了其对发射模式光纤尖端耦合效率的影响。

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