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关于多切片模拟揭示的会聚束电子衍射(CBED)花样形成的特性

On the peculiarities of CBED pattern formation revealed by multislice simulation.

作者信息

Chuvilin A, Kaiser U

机构信息

University of Ulm, Albert-Einstein-Alee 11, D-89081 Ulm, Germany.

出版信息

Ultramicroscopy. 2005 Aug;104(1):73-82. doi: 10.1016/j.ultramic.2005.03.003. Epub 2005 Apr 7.

Abstract

A modified multislice method has been developed for calculations of Convergent Beam Electron Diffraction (CBED) patterns. The validity of the method for HOLZ- and Kikuchi-line calculations has been proofed by comparison to Bloch-wave calculations. The application of the method leads to the new understanding of CBED patterns formation. Dynamical scattering of weak HOLZ reflections plays the key role in the appearance of deficient lines in the central CBED disk. Different HOLZ lines do have significantly different and extended scattering areas; the central 000 CBED disk, consequently, contains structural information from an area around the primary beam which is determined by the Bragg angle of HOLZ reflections and the thickness of the sample. A variation of lattice parameters, if present within this area, results in artificial symmetry violations of the pattern and in changes of line profiles.

摘要

已开发出一种改进的多切片方法用于计算会聚束电子衍射(CBED)图案。通过与布洛赫波计算结果进行比较,证明了该方法在高阶劳厄带(HOLZ)和菊池线计算中的有效性。该方法的应用使人们对CBED图案的形成有了新的认识。弱HOLZ反射的动态散射在中心CBED圆盘上缺失线的出现中起关键作用。不同的HOLZ线具有明显不同且扩展的散射区域;因此,中心的000 CBED圆盘包含来自初级束周围区域的结构信息,该区域由HOLZ反射的布拉格角和样品厚度决定。如果在该区域内存在晶格参数变化,则会导致图案出现人为的对称性破坏和线轮廓的变化。

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