Kawai Jun
Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan.
Anal Sci. 2005 Jul;21(7):733-5. doi: 10.2116/analsci.21.733.
Radiative Auger spectra are weak X-ray emission spectra near the characteristic X-ray lines. Radiative Auger process is an intrinsic energy-loss process in an atom when a characteristic X-ray photon is emitted, due to an atomic many-body effect. The energy loss spectra correspond to the unoccupied conduction band structure of materials. Therefore the radiative Auger effect is an alternative tool to the X-ray absorption spectroscopy such as EXAFS (Extended X-ray Absorption Fine Structure) and XANES (X-ray Absorption Near Edge Structure), and thus it is named EXEFS (Extended X-ray Emission Fine Structure). By the use of a commercially available X-ray fluorescence spectrometer or an electron probe microanalyzer (EPMA), which are frequently used in materials industries, we can obtain an EXEFS spectrum within 20 min. The radiative Auger effect, as an example, demonstrates that the study on atomic many-body effects has become a powerful tool for crystal and electronic structure characterizations. The EXEFS method has already been used in many industries in Japan. Reviews about the applications and basic study results on the radiative Auger effect are reported in this paper.
辐射俄歇谱是特征X射线谱线附近的微弱X射线发射谱。辐射俄歇过程是原子在发射特征X射线光子时由于原子多体效应而产生的一种本征能量损失过程。能量损失谱对应于材料的未占据导带结构。因此，辐射俄歇效应是一种替代X射线吸收光谱（如扩展X射线吸收精细结构（EXAFS）和X射线吸收近边结构（XANES））的工具，因而被命名为扩展X射线发射精细结构（EXEFS）。通过使用材料工业中常用的市售X射线荧光光谱仪或电子探针微分析仪（EPMA），我们可以在20分钟内获得EXEFS谱。例如，辐射俄歇效应表明，对原子多体效应的研究已成为晶体和电子结构表征的有力工具。EXEFS方法在日本已被广泛应用于许多行业。本文报道了有关辐射俄歇效应的应用和基础研究成果的综述。
