Verkerk Arie O, Wilders Ronald, Schulze-Bahr Eric, Beekman Leander, Bhuiyan Zahurul A, Bertrand Jessica, Eckardt Lars, Lin Dongxin, Borggrefe Martin, Breithardt Günter, Mannens Marcel M A M, Tan Hanno L, Wilde Arthur A M, Bezzina Connie R
Department of Experimental Cardiology, Academic Medical Center, University of Amsterdam, Meibergdreef 15, 1105 AZ Amsterdam, The Netherlands.
Cardiovasc Res. 2005 Dec 1;68(3):441-53. doi: 10.1016/j.cardiores.2005.06.027. Epub 2005 Jul 25.
Brugada syndrome (BrS) is an inherited electrical disorder associated with a high incidence of sudden death. In a minority of patients, it has been linked to mutations in SCN5A, the gene encoding the pore-forming alpha-subunit of the cardiac Na(+) channel. Other causally related genes still await identification. We evaluated the role of HERG (KCNH2), which encodes the alpha-subunit of the rapid delayed rectifier K(+) channel (I(Kr)), in BrS.
In two unrelated SCN5A mutation-negative patients, different amino acid changes in the C-terminal domain of the HERG channel (G873S and N985S) were identified. Voltage-clamp experiments on transfected HEK-293 cells show that these changes increase I(Kr) density and cause a negative shift of voltage-dependent inactivation, resulting in increased rectification. Action potential (AP) clamp experiments reveal increased transient HERG peak currents (I(peak)) during phase-0 and phase-1 of the ventricular AP, particularly at short cycle length. Computer simulations demonstrate that the increased I(peak) enhances the susceptibility to loss of the AP-dome typically in right ventricular subepicardial myocytes, thereby contributing to the BrS phenotype.
Our study reveals a modulatory role of I(Kr) in BrS. These findings may provide better understanding of BrS and have implications for diagnosis and therapy.
Brugada综合征(BrS)是一种遗传性电紊乱疾病,与猝死的高发生率相关。在少数患者中,它与SCN5A基因突变有关,SCN5A基因编码心脏钠通道(Na(+)通道)的孔形成α亚基。其他因果相关基因仍有待确定。我们评估了编码快速延迟整流钾通道(I(Kr))α亚基的HERG(KCNH2)在BrS中的作用。
在两名无血缘关系的SCN5A突变阴性患者中,鉴定出HERG通道C末端结构域的不同氨基酸变化(G873S和N985S)。对转染的HEK - 293细胞进行电压钳实验表明,这些变化增加了I(Kr)密度,并导致电压依赖性失活的负向移位,从而导致整流增加。动作电位(AP)钳实验显示,在心室AP的0期和1期,特别是在短周期长度时,瞬时HERG峰值电流(I(peak))增加。计算机模拟表明,增加的I(peak)增强了右心室心外膜下心肌细胞中典型的AP圆顶丢失的易感性,从而导致BrS表型。
我们的研究揭示了I(Kr)在BrS中的调节作用。这些发现可能有助于更好地理解BrS,并对诊断和治疗具有启示意义。