Matschat Ralf, Hassler Jürgen, Traub Heike, Dette Angelika
Federal Institute for Materials Research and Testing (BAM), Richard-Willstätter-Strasse 11, 12489, Berlin, Germany.
Anal Bioanal Chem. 2005 Dec;383(7-8):1060-74. doi: 10.1007/s00216-005-3415-x. Epub 2005 Aug 4.
The members of the committee NMP 264 "Chemical analysis of non-oxidic raw and basic materials" of the German Standards Institute (DIN) have organized two interlaboratory comparisons for multielement determination of trace elements in silicon carbide (SiC) powders via direct solid sampling methods. One of the interlaboratory comparisons was based on the application of inductively coupled plasma optical emission spectrometry with electrothermal vaporization (ETV ICP OES), and the other on the application of optical emission spectrometry with direct current arc (DC arc OES). The interlaboratory comparisons were organized and performed in the framework of the development of two standards related to "the determination of mass fractions of metallic impurities in powders and grain sizes of ceramic raw and basic materials" by both methods. SiC powders were used as typical examples of this category of material. The aim of the interlaboratory comparisons was to determine the repeatability and reproducibility of both analytical methods to be standardized. This was an important contribution to the practical applicability of both draft standards. Eight laboratories participated in the interlaboratory comparison with ETV ICP OES and nine in the interlaboratory comparison with DC arc OES. Ten analytes were investigated by ETV ICP OES and eleven by DC arc OES. Six different SiC powders were used for the calibration. The mass fractions of their relevant trace elements were determined after wet chemical digestion. All participants followed the analytical requirements described in the draft standards. In the calculation process, three of the calibration materials were used successively as analytical samples. This was managed in the following manner: the material that had just been used as the analytical sample was excluded from the calibration, so the five other materials were used to establish the calibration plot. The results from the interlaboratory comparisons were summarized and used to determine the repeatability and the reproducibility (expressed as standard deviations) of both methods. The calculation was carried out according to the related standard. The results are specified and discussed in this paper, as are the optimized analytical conditions determined and used by the authors of this paper. For both methods, the repeatability relative standard deviations were <25%, usually ~10%, and the reproducibility relative standard deviations were <35%, usually ~15%. These results were regarded as satifactory for both methods intended for rapid analysis of materials for which decomposition is difficult and time-consuming. Also described are some results from an interlaboratory comparison used to certify one of the materials that had been previously used for validation in both interlaboratory comparisons. Thirty laboratories (from eight countries) participated in this interlaboratory comparison for certification. As examples, accepted results are shown from laboratories that used ETV ICP OES or DC arc OES and had performed calibrations by using solutions or oxides, respectively. The certified mass fractions of the certified reference materials were also compared with the mass fractions determined in the interlaboratory comparisons performed within the framework of method standardization. Good agreement was found for most of the analytes.
德国标准化学会(DIN)的NMP 264委员会“非氧化物原料和基础材料的化学分析”成员组织了两次实验室间比对,通过直接固体进样法对碳化硅(SiC)粉末中的微量元素进行多元素测定。其中一次实验室间比对基于电感耦合等离子体光发射光谱法与电热蒸发联用(ETV ICP OES),另一次基于直流电弧光发射光谱法(DC arc OES)。这两次实验室间比对是在通过这两种方法制定两项与“陶瓷原料和基础材料粉末中金属杂质质量分数及粒度的测定”相关标准的框架内组织和开展的。SiC粉末被用作这类材料的典型示例。实验室间比对的目的是确定两种待标准化分析方法的重复性和再现性。这对两项标准草案的实际适用性做出了重要贡献。八个实验室参与了ETV ICP OES的实验室间比对,九个实验室参与了DC arc OES的实验室间比对。ETV ICP OES研究了十种分析物,DC arc OES研究了十一种分析物。使用六种不同的SiC粉末进行校准。通过湿化学消解后测定其相关微量元素的质量分数。所有参与者均遵循标准草案中描述的分析要求。在计算过程中,依次将三种校准材料用作分析样品。具体做法如下:刚用作分析样品的材料被排除在校准之外,因此使用其他五种材料建立校准曲线。总结了实验室间比对的结果,并用于确定两种方法的重复性和再现性(以标准偏差表示)。计算按照相关标准进行。本文给出了结果并进行了讨论,还给出了本文作者确定并使用的优化分析条件。对于这两种方法,重复性相对标准偏差均<25%,通常约为10%,再现性相对标准偏差<35%,通常约为15%。对于旨在对难以分解且耗时的材料进行快速分析的两种方法而言,这些结果被认为是令人满意的。文中还介绍了一次实验室间比对的一些结果,该比对用于对之前在两次实验室间比对中用于验证的一种材料进行认证。三十个实验室(来自八个国家)参与了此次认证的实验室间比对。作为示例,展示了分别使用ETV ICP OES或DC arc OES并分别使用溶液或氧化物进行校准的实验室的认可结果。还将有证标准物质的认证质量分数与在方法标准化框架内进行的实验室间比对中测定的质量分数进行了比较。发现大多数分析物的结果吻合良好。