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用于碳化硅粉末直接光谱分析的各种校准技术的比较。

Comparison of various calibration techniques for the direct spectroscopical analysis of SiC powders.

作者信息

Flórián K, Hassler J, Schrön W

机构信息

Department of Chemistry, Faculty of Metallurgy, Technical University of Kosice, Letná 9, SK-042 00, Kosice, Slovakia.

出版信息

Anal Bioanal Chem. 1996 Jun;355(5-6):601-5. doi: 10.1007/s0021663550601.

DOI:10.1007/s0021663550601
PMID:15045324
Abstract

Techniques for the direct analysis of powdered advanced ceramics provide an advantageous alternative to methods using wet digestion in sample preparation. The direct spectrochemical methods based on electrothermal vaporization (ETV-ICP-OES, solid-ETV-AAS, etc.) show a great similarity to the classical method of d. c. arc excitation. The calibration procedure is the major difficulty of all techniques applied for direct solid sample analysis, as there is a lack of suitable reference materials of ceramics. Consequently, it was necessary to verify various possibilities of preparation and application of model calibration samples. The results of such a calibration are compared with those using within-laboratory standards.

摘要

对粉末状先进陶瓷进行直接分析的技术为样品制备中使用湿法消解的方法提供了一种有利的替代方案。基于电热蒸发的直接光谱化学方法(ETV-ICP-OES、固体ETV-AAS等)与经典的直流电弧激发方法有很大的相似性。校准程序是所有应用于直接固体样品分析的技术的主要难点,因为缺乏合适的陶瓷参考材料。因此,有必要验证模型校准样品制备和应用的各种可能性。将这种校准的结果与使用实验室内部标准的结果进行比较。

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