Suzuki Masao, Tsuruoka Chizuru, Kanai Tatsuaki, Kato Takeshi, Yatagai Fumio, Watanabe Masami
International Space Radiation Laboratory, National Institute of Radiological, Sciences, 4-9-1 Anagawa, Chiba-shi 263-8555, Japan.
Mutat Res. 2006 Feb 22;594(1-2):86-92. doi: 10.1016/j.mrfmmm.2005.08.007. Epub 2005 Nov 15.
We investigated the linear energy transfer (LET) dependence of mutation induction on the hypoxanthine-guanine phosphoribosyl transferase (HPRT) locus in normal human fibroblast-like cells irradiated with accelerated neon-ion beams. The cells were irradiated with neon-ion beams at various LETs ranging from 63 to 335 keV/microm. Neon-ion beams were accelerated by the Riken Ring Cyclotron at the Institute of Physical and Chemical Research in Japan. Mutation induction at the HPRT locus was detected to measure 6-thioguanine-resistant clones. The mutation spectrum of the deletion pattern of exons of mutants was analyzed using the multiplex polymerase chain reaction (PCR). The dose-response curves increased steeply up to 0.5 Gy and leveled off or decreased between 0.5 and 1.0 Gy, compared to the response to (137)Cs gamma-rays. The mutation frequency increased up to 105 keV/microm and then there was a downward trend with increasing LET values. The deletion pattern of exons was non-specific. About 75-100% of the mutants produced using LETs ranging from 63 to 335 keV/mum showed all or partial deletions of exons, while among gamma-ray-induced mutants 30% showed no deletions, 30% partial deletions and 40% complete deletions. These results suggested that the dose-response curves of neon-ion-induced mutations were dependent upon LET values, but the deletion pattern of DNA was not.
我们研究了用加速氖离子束辐照正常人成纤维细胞样细胞时,次黄嘌呤 - 鸟嘌呤磷酸核糖转移酶(HPRT)基因座上突变诱导的传能线密度(LET)依赖性。细胞用LET范围从63至335keV/μm的氖离子束进行辐照。氖离子束由日本理化研究所的理研环型回旋加速器加速。通过检测6-硫鸟嘌呤抗性克隆来测定HPRT基因座处的突变诱导。使用多重聚合酶链反应(PCR)分析突变体中外显子缺失模式的突变谱。与对(137)Csγ射线的响应相比,剂量 - 反应曲线在0.5Gy之前急剧上升,在0.5至1.0Gy之间趋于平稳或下降。突变频率在LET值达到105keV/μm时增加,然后随着LET值增加呈下降趋势。外显子的缺失模式是非特异性的。使用LET范围从63至335keV/μm产生的突变体中,约75 - 100%显示外显子全部或部分缺失,而在γ射线诱导的突变体中,30%无缺失,30%部分缺失,40%完全缺失。这些结果表明,氖离子诱导突变的剂量 - 反应曲线取决于LET值,但DNA的缺失模式并非如此。