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[重离子束和X射线诱导的突变:对培养细胞系的分析]

[Mutation induction by heavy ion beams and X-rays: analysis with cultured cell line].

作者信息

Toya K, Shigematsu N, Ito H, Yamashita S, Kubo A, Kanai T

机构信息

Department of Radiology, Keio University School of Medicine.

出版信息

Nihon Igaku Hoshasen Gakkai Zasshi. 1996 Sep;56(11):736-40.

PMID:8914407
Abstract

This study was performed to determine the biological effects of heavy ion beams on cultured cells. V79 cells were irradiated with carbon or neon beams or X-rays, and cell survivals was calculated by the colony assay method. The Do values for 150 kVp X-rays, 20 keV/micron and 80 keV/micron carbon beams, and 80 keV/micron neon beams were 2.2Gy, 1.8Gy, 1.0Gy and 1.4Gy, respectively. After 7-10 day expression periods, the mutation frequencies at the hypoxanthine-guanine phosphribosyl transferase (hprt) locus were analyzed from the numbers of colonies formed in media supplemented with 6-thioguanine. An extremely higher frequency of mutation was observed with heavy ion beams compared with X-rays. Both cell killing effect and the mutation induction were enhanced when the LET of carbon beams was increased from 20 to 80 keV/micron. These results mean that carbon beams had a stronger cell-killing effect than X-rays, but also carried a high risk of mutation induction. On the other hand, neon beams yielded cell survival curves similar to those of carbon beams, but they had a smaller mutation induction effect than carbon beams. The effect of fractionated irradiation (3 hr interval) on cell survival and mutation frequency were also examined. When cells were irradiated with X-rays, cell survival was increased by fractionation, but the mutation frequency was not modified. Irradiating cells with fractionated carbon beams, survival curves were not affected, but mutation frequency was reduced.

摘要

本研究旨在确定重离子束对培养细胞的生物学效应。用碳束、氖束或X射线照射V79细胞,并通过集落测定法计算细胞存活率。150 kVp X射线、20 keV/微米和80 keV/微米碳束以及80 keV/微米氖束的Do值分别为2.2 Gy、1.8 Gy、1.0 Gy和1.4 Gy。在7 - 10天的表达期后,根据在添加6 - 硫鸟嘌呤的培养基中形成的集落数量,分析次黄嘌呤 - 鸟嘌呤磷酸核糖转移酶(hprt)位点的突变频率。与X射线相比,重离子束观察到极高的突变频率。当碳束的传能线密度从20 keV/微米增加到80 keV/微米时,细胞杀伤效应和突变诱导均增强。这些结果意味着碳束比X射线具有更强的细胞杀伤效应,但也具有高的突变诱导风险。另一方面,氖束产生的细胞存活曲线与碳束相似,但它们的突变诱导效应比碳束小。还研究了分次照射(间隔3小时)对细胞存活和突变频率的影响。当用X射线照射细胞时,分次照射可提高细胞存活率,但突变频率未改变。用分次碳束照射细胞时,存活曲线不受影响,但突变频率降低。

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