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Experimental evidence for modulations in the relative double-photoionization cross section of C60 from threshold up to 280 eV.

作者信息

Juranić P N, Lukić D, Barger K, Wehlitz R

机构信息

Synchrotron Radiation Center, University of Wisconsin, Stoughton, Wisconsin 53589, USA.

出版信息

Phys Rev Lett. 2006 Jan 20;96(2):023001. doi: 10.1103/PhysRevLett.96.023001. Epub 2006 Jan 18.

Abstract

The relative double-photoionization cross section of neutral C60 clusters was investigated using monochromatized synchrotron radiation between 18 and 283 eV. Our measurement of the double-to-single photoionization ratio reveals two modulating components that are superimposed on a smooth ratio curve from threshold (19.0 eV) up to 280 eV, when inner-shell excitations become possible. The maxima in the modulation can be related to geometrical dimensions of the C60 cluster.

摘要

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