Kamino Takeo, Yaguchi Toshie, Konno Mitsuru, Watabe Akira, Marukawa Tomotaka, Mima Takayuki, Kuroda Kotaro, Saka Hiroyasu, Arai Shigeo, Makino Hiroshi, Suzuki Yoshinao, Kishita Keisuke
Hitachi High Technologies Corporation Hitachinaka Ibaraki 312-0057, Japan.
J Electron Microsc (Tokyo). 2005 Dec;54(6):497-503. doi: 10.1093/jmicro/dfi071. Epub 2006 Feb 22.
A new gas injection/specimen heating holder is developed for the purpose of in situ observation of gas reaction of materials at high temperatures in a transmission electron microscope at near-atomic resolution. A fine tungsten wire is employed as a heating element of the holder and a battery is used as the power source. Gas was injected onto specimens in the form of particles lying on the heating element via a nozzle. The maximum pressure near specimens was middle of 10(-2) Pa, while the pressure in the electron-gun chamber was kept to 2 x 10(-4) Pa. This gas injection/specimen heating holder was applied to observe solid-gas reactions. The reactions observed include oxidation of pure In into In2O3, reduction of SiO2 into Si and re-oxidation of Si into SiO2.
为了在透射电子显微镜中以近原子分辨率对材料在高温下的气体反应进行原位观察,开发了一种新的气体注入/样品加热支架。该支架采用细钨丝作为加热元件,使用电池作为电源。气体通过喷嘴以颗粒形式注入位于加热元件上的样品。样品附近的最大压力为10^(-2) Pa的中间值,而电子枪腔中的压力保持在2×10^(-4) Pa。这种气体注入/样品加热支架被用于观察固气反应。观察到的反应包括纯铟氧化成氧化铟、二氧化硅还原成硅以及硅再氧化成二氧化硅。