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一种用于对骨与金属植入物之间完整界面进行高分辨率透射电子显微镜观察的新型工具。

A novel tool for high-resolution transmission electron microscopy of intact interfaces between bone and metallic implants.

作者信息

Engqvist H, Botton G A, Couillard M, Mohammadi S, Malmström J, Emanuelsson L, Hermansson L, Phaneuf M W, Thomsen P

机构信息

The Angstrom Laboratory, Department of Materials Science, Uppsala University, Box 534, 751 21 Uppsala, Sweden.

出版信息

J Biomed Mater Res A. 2006 Jul;78(1):20-4. doi: 10.1002/jbm.a.30696.

DOI:10.1002/jbm.a.30696
PMID:16596587
Abstract

A key feature in the understanding of the mechanisms of integration versus rejection of implanted materials is a deepened understanding of the elemental and molecular compositions of the interface zone between the surface of the synthetic man-made material and the biological components of tissue. Intact interfaces between metallic implants and tissues have not been able to image and analyse on the ultrastructural level with the common transmission electron microscopy (TEM) sample preparation techniques. By using focused ion beam microscopy for site-specific preparation of TEM samples, intact interfaces between metal implants and calcified tissue were imaged for the first time. The interface's elemental and crystallographic compositions were determined using energy dispersive X-ray mapping and electron diffraction. The developed technique fulfills a long-sought-for demand to correlate the surface properties of implanted metal prostheses with the fine structure and composition of preserved interfaces with tissues.

摘要

理解植入材料整合与排斥机制的一个关键特征是,要更深入地了解合成人造材料表面与组织生物成分之间界面区域的元素和分子组成。使用常规的透射电子显微镜(TEM)样品制备技术,无法在超微结构水平对金属植入物与组织之间完整的界面进行成像和分析。通过使用聚焦离子束显微镜对TEM样品进行定点制备,首次对金属植入物与钙化组织之间完整的界面进行了成像。利用能量色散X射线映射和电子衍射确定了界面的元素和晶体组成。所开发的技术满足了长期以来的需求,即将植入金属假体的表面特性与与组织保留界面的精细结构和组成联系起来。

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