van Veenendaal Michel
Department of Physics, Northern Illinois University, De Kalb, Illinois 60115, USA.
Phys Rev Lett. 2006 Mar 24;96(11):117404. doi: 10.1103/PhysRevLett.96.117404. Epub 2006 Mar 23.
The resonant inelastic x-ray scattering (RIXS) cross section at the L and M edges of transition-metal compounds is studied using an effective scattering operator. The intensities of the elastic peak and for spin-flip processes are derived. It is shown how the polarization dependence can be used to select transitions. Comparisons are made with experiment. A detailed analysis of the polarization and angular dependence of L- and M-edge RIXS for divalent copper compounds, such as the high-Tc superconductors, is given.