de Groot Frank M F, Glatzel Pieter, Bergmann Uwe, van Aken Peter A, Barrea Raul A, Klemme Stephan, Hävecker Michael, Knop-Gericke Axel, Heijboer Willem M, Weckhuysen Bert M
Department of Inorganic Chemistry and Catalysis, Debye Institute, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, The Netherlands.
J Phys Chem B. 2005 Nov 10;109(44):20751-62. doi: 10.1021/jp054006s.
1s2p resonant inelastic X-ray scattering (RIXS) spectroscopy has been measured for a series of iron oxides, including octahedral and tetrahedral Fe(II) and Fe(III) systems. Their spectral shapes have been analyzed and explained using crystal-field multiplet simulations. The RIXS planes and the K-edge and L-edge X-ray absorption spectra related to these RIXS planes will be discussed with respect to their analytical opportunities. It is concluded that the full power and possibilities of 1s2p RIXS needs an overall resolution of 0.3 eV. This will yield a technique with more detailed information than K-edge and L-edge X-ray absorption combined, obtained in a single experiment. Another major advantage is that 1s2p RIXS involves only hard X-rays, and experiments under essentially any condition and on any system are feasible.
已对一系列铁氧化物进行了1s2p共振非弹性X射线散射（RIXS）光谱测量，包括八面体和四面体Fe（II）及Fe（III）体系。已使用晶体场多重态模拟对它们的光谱形状进行了分析和解释。将针对其分析机会讨论与这些RIXS平面相关的RIXS平面以及K边和L边X射线吸收光谱。得出的结论是，1s2p RIXS的全部能力和可能性需要0.3 eV的整体分辨率。这将产生一种比在单个实验中获得的K边和L边X射线吸收相结合具有更详细信息的技术。另一个主要优点是1s2p RIXS仅涉及硬X射线，并且在基本上任何条件下对任何体系进行实验都是可行的。
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