Sterrer Martin, Fischbach Esther, Heyde Markus, Nilius Niklas, Rust Hans-Peter, Risse Thomas, Freund Hans-Joachim
Department of Chemical Physics, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany. sterrer@ fhi-berlin.mpg.de
J Phys Chem B. 2006 May 4;110(17):8665-9. doi: 10.1021/jp060546t.
The formation of surface color centers (F(S) centers) by electron bombardment of thin MgO(001) films is investigated using electron paramagnetic resonance and low-temperature scanning tunneling microscopy. At low electron doses both techniques indicate the formation of singly occupied color centers (F(S)(+)), whereas at high electron doses the doubly occupied type (F(S)(0)) is dominant. It is suggested that with increasing electron dose F(S)(+) centers are transformed into F(S)(0). Tunneling spectra of individual F(S)(0) centers reveal a large distribution of energetic positions of occupied and unoccupied states, which is caused by local variations of the coordination number of the defects and explains the broad signals usually detected with integrating spectroscopic techniques.
利用电子顺磁共振和低温扫描隧道显微镜研究了电子轰击薄MgO(001)薄膜形成表面色心(F(S)中心)的过程。在低电子剂量下,两种技术均表明形成了单占据色心(F(S)(+)),而在高电子剂量下,双占据类型(F(S)(0))占主导。有人提出,随着电子剂量的增加,F(S)(+)中心会转变为F(S)(0)。单个F(S)(0)中心的隧道谱显示,占据态和未占据态的能量位置分布很广,这是由缺陷配位数的局部变化引起的,并且解释了通常用积分光谱技术检测到的宽信号。