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金属和金属间化合物中位错核心的高分辨透射电子显微镜及薄膜效应

HRTEM of dislocation cores and thin-foil effects in metals and intermetallic compounds.

作者信息

Mills M J, Baluc N L, Sarosi P M

机构信息

Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, USA.

出版信息

Microsc Res Tech. 2006 May;69(5):317-29. doi: 10.1002/jemt.20288.

Abstract

Examples of the observation and analysis of dislocation cores and dislocation fine structure in metals and intermetallics using high resolution transmission electron microscopy are discussed. Specific examples include the 60 degrees dislocations in aluminum, a011 edge dislocations in NiAl, and screw dislocations in Ni3Al. The effect of the thin TEM foils on the structure and imaging of these dislocations is discussed in light of embedded atom method calculations for several configurations and coupled with image simulations. Some generalizations based on these calculations are discussed. These analyses enables determination of the spreading or decomposition of the edge component of the cores, both in and out of the glide plane, which can have significant implications for the modeling of macroscopic behavior.

摘要

讨论了使用高分辨率透射电子显微镜对金属和金属间化合物中位错核心及位错精细结构进行观察和分析的实例。具体实例包括铝中的60度位错、NiAl中的a011刃型位错以及Ni3Al中的螺型位错。根据对几种构型的嵌入原子法计算并结合图像模拟,讨论了薄透射电子显微镜箔对这些位错的结构和成像的影响。基于这些计算进行了一些归纳总结。这些分析能够确定核心边缘分量在滑移面内外的扩展或分解情况,这对宏观行为的建模可能具有重要意义。

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