Gillen Greg, Mahoney Christine, Wight Scott, Lareau Richard
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Rapid Commun Mass Spectrom. 2006;20(12):1949-53. doi: 10.1002/rcm.2531.
The use of secondary ion mass spectrometry (SIMS) for the detection and spatially resolved analysis of individual high explosive particles is described. A C(8) (-) carbon cluster primary ion beam was used in a commercial SIMS instrument to analyze samples of high explosives dispersed as particles on silicon substrates. In comparison with monatomic primary ion bombardment, the carbon cluster primary ion beam was found to greatly enhance characteristic secondary ion signals from the explosive compounds while causing minimal beam-induced degradation. The resistance of these compounds to degradation under ion bombardment allows explosive particles to be analyzed under high primary ion dose bombardment (dynamic SIMS) conditions, facilitating the rapid acquisition of spatially resolved molecular information. The use of cluster SIMS combined with computer control of the sample stage position allows for the automated identification and counting of explosive particle distributions on silicon surfaces. This will be useful for characterizing the efficiency of transfer of particulates in trace explosive detection portal collectors and/or swipes utilized for ion mobility spectrometry applications.
本文描述了利用二次离子质谱法（SIMS）检测单个高能炸药颗粒并进行空间分辨分析。在商用SIMS仪器中使用C(8)(-)碳簇一次离子束，分析以颗粒形式分散在硅基片上的高能炸药样品。与单原子一次离子轰击相比，发现碳簇一次离子束能极大地增强炸药化合物的特征二次离子信号，同时使束致降解最小化。这些化合物在离子轰击下的抗降解性使得能够在高一次离子剂量轰击（动态SIMS）条件下分析炸药颗粒，便于快速获取空间分辨的分子信息。将簇SIMS与样品台位置的计算机控制相结合，能够自动识别和计数硅表面上炸药颗粒的分布。这对于表征痕量炸药检测入口收集器和/或用于离子迁移谱应用的擦拭物中颗粒转移效率将是有用的。
