Girgis E, Pogossian S P, Benkhedar M L
Solid State Physics Department, National Research Centre, Dokki, Cairo, Egypt.
J Nanosci Nanotechnol. 2006 Apr;6(4):1135-9. doi: 10.1166/jnn.2006.181.
The influence of the created surface roughness on the coercivity of magnetic thin films has been investigated. The magnetic thin films (CoFe and alternatively NiFe) are sputtered on top of smooth substrates that were previously covered with an array of considerably rougher lines with one of these materials Pt, Cu, CoFe, and NiFe. The lines have been patterned using optical lithography into arrays that are deposited with different thicknesses varying between 5 nm-15 nm. The lines have been designed to have a very rough edge and seated in two different angles relative to the wafer edge (zero and 45 degrees). Magneto-optic Kerr effect (MOKE) measurements showed two distinct switching fields in the hysteresis loops that are due to magnetic domain wall trapping created by the surface roughness. The magnetization reversal showed a strong dependence on the height, the orientation angle, and the material's type of the created surface roughness (the lines).
研究了所产生的表面粗糙度对磁性薄膜矫顽力的影响。磁性薄膜（CoFe以及交替的NiFe）被溅射在光滑衬底上，这些衬底先前覆盖有由Pt、Cu、CoFe和NiFe这些材料之一构成的一系列粗糙度相当大的线条。这些线条通过光刻技术图案化为阵列，其沉积厚度在5纳米至15纳米之间变化。这些线条被设计成具有非常粗糙的边缘，并相对于晶圆边缘以两种不同角度放置（零度和45度）。磁光克尔效应（MOKE）测量表明，磁滞回线中有两个不同的开关场，这是由于表面粗糙度产生的磁畴壁捕获所致。磁化反转表现出对所产生的表面粗糙度（线条）的高度、取向角和材料类型有强烈依赖性。
