Naab Fabian U, Holland Orin W, Duggan Jerome L, McDaniel Floyd D
Ion Beam Modification and Analysis Laboratory, Department of Physics, P.O. Box 311427, University of North Texas, Denton, TX 76203-1427, USA.
J Phys Chem B. 2005 Feb 3;109(4):1415-9. doi: 10.1021/jp040592y.
The utility of ion beam analysis (IBA) techniques to quantitatively determine impurities in carbon nanotubes (CNTs) over a wide range of atomic numbers is demonstrated. Such techniques have not previously been used to monitor impurities and their effects in this unique material. Despite the difficulty in mounting the samples (which generally are formed into a powdery aggregate rather in a thin film), it is shown that reliable and accurate measurements of impurity concentrations can be achieved. Particle-induced X-ray emission (PIXE) and elastic recoil detection (ERD) analyses were used to characterize both metallic and very light (e.g., hydrogen) impurities in CNTs. This paper reports the first direct measurement of hydrogen in CNTs using an IBA technique. This is significant because CNTs are being actively investigated for hydrogen storage technology for energy applications.
已证明离子束分析（IBA）技术在广泛原子序数范围内定量测定碳纳米管（CNT）中杂质的实用性。此类技术此前尚未用于监测这种独特材料中的杂质及其影响。尽管在安装样品方面存在困难（样品通常形成粉末状聚集体而非薄膜），但结果表明可以实现对杂质浓度的可靠且准确的测量。采用粒子诱导X射线发射（PIXE）和弹性反冲探测（ERD）分析来表征碳纳米管中的金属杂质和极轻杂质（例如氢）。本文报道了首次使用IBA技术直接测量碳纳米管中的氢。这一点很重要，因为碳纳米管正被积极研究用于能源应用的储氢技术。
