Creutz Carol, Brunschwig Bruce S, Sutin Norman
Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973-5000, USA.
J Phys Chem B. 2005 May 26;109(20):10251-60. doi: 10.1021/jp050259+.
Optically induced charge transfer between adsorbed molecules and a metal electrode was predicted by Hush to lead to new electronic absorption features but has not been experimentally observed. However, Gerischer characterized photocurrents arising from such absorption between adsorbed metal atoms and semiconductor conduction bands. Interfacial charge-transfer absorption (IFCTA) provides information concerning the barriers to charge transfer between molecules and the metal/semiconductor and the magnitude of the electronic coupling and could thus provide a powerful tool for understanding interfacial charge-transfer kinetics. Here we provide a framework for modeling and predicting IFCTA spectra. The key feature of optical charge transfer to or from a band of electronic levels (taken to have a constant density of states and electronic coupling element) is that the absorption probability reaches half intensity at lambda + DeltaG(theta), where lambda and DeltaG(theta) are the reorganization energy and free-energy gap for the optical charge transfer, attains >90% intensity at lambda + DeltaG(theta) + 0.9 square root[4lambdak(B)T], and remains essentially constant until the top (bottom) level of the band is attained. However, when the electronic coupling and transition moment are assumed to be independent of photon energy (Mulliken-Hush model), a peaked, highly asymmetric absorption profile is predicted. We conclude that, in general, the electronic coupling between molecular adsorbates and the metal levels is so small that absorption is not detectable, whereas for semiconductors there may be intense features involving coupling to surface states.
哈什预测,吸附分子与金属电极之间的光诱导电荷转移会导致新的电子吸收特征,但尚未得到实验证实。然而,格里斯彻对吸附金属原子与半导体导带之间这种吸收产生的光电流进行了表征。界面电荷转移吸收(IFCTA)提供了有关分子与金属/半导体之间电荷转移势垒以及电子耦合强度的信息,因此可能成为理解界面电荷转移动力学的有力工具。在此,我们提供了一个用于模拟和预测IFCTA光谱的框架。光致电荷转移至或来自一系列电子能级(假设具有恒定的态密度和电子耦合元素)的关键特征在于,吸收概率在λ + ΔG(θ)处达到半强度,其中λ和ΔG(θ)分别是光致电荷转移的重组能和自由能隙;在λ + ΔG(θ) + 0.9√[4λk(B)T]处吸收概率达到>90%强度,并且在达到能带的顶部(底部)能级之前基本保持恒定。然而,当假设电子耦合和跃迁矩与光子能量无关时(穆利肯 - 哈什模型),预测会出现一个峰值、高度不对称的吸收谱。我们得出结论,一般来说,分子吸附物与金属能级之间的电子耦合非常小,以至于无法检测到吸收,而对于半导体,可能存在涉及与表面态耦合的强烈特征。