Chen Si-Guang, Stradins Paul, Gregg Brian A
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401, USA.
J Phys Chem B. 2005 Jul 21;109(28):13451-60. doi: 10.1021/jp0506080.
An in-depth study of n-type doping in a crystalline perylene diimide organic semiconductor (PPEEB) reveals that electrostatic attractions between the dopant electron and its conjugate dopant cation cause the free carrier density to be much lower than the doping density. Measurements of the dark currents as a function of field, doping density, electrode spacing, and temperature are reported along with preliminary Hall-effect measurements. The activation energy of the current, E(aJ), decreases with increasing field and with increasing dopant density, n(d). It is the measured change in E(aJ) with n(d) that accounts primarily for the variations between PPEEB films; the two adjustable parameters employed to fit the current-voltage data proved to be almost constants, independent of n(d) and temperature. The free electron density and the electron mobility are nonlinearly coupled through their shared dependences on both field and temperature. The data are fit to a modified Poole-Frenkel-like model that is shown to be valid for three important electronic processes in organic (excitonic) semiconductors: excitonic effects, doping, and transport. At room temperature, the electron mobility in PPEEB films is estimated to be 0.3 cm(2)/Vs; the fitted value of the mobility for an ideal PPEEB crystal is 3.4 +/- 2.7 cm(2)/Vs. The modified Poole-Frenkel factor that describes the field dependence of the current is 2 +/- 1 x 10(-4) eV (cm/V)(1/2). The analytical model is surprisingly accurate for a system that would require a coupled set of nonlinear tensor equations to describe it precisely. Being based on general electrostatic considerations, our model can form the requisite foundation for treatments of more complex systems. Some analogies to adventitiously doped materials such as pi-conjugated polymers are proposed.
对一种结晶苝二酰亚胺有机半导体(PPEEB)中n型掺杂的深入研究表明,掺杂电子与其共轭掺杂阳离子之间的静电引力导致自由载流子密度远低于掺杂密度。报告了暗电流随电场、掺杂密度、电极间距和温度变化的测量结果以及初步的霍尔效应测量结果。电流的激活能E(aJ) 随电场增加和掺杂密度n(d) 增加而降低。正是E(aJ) 随n(d) 的测量变化主要解释了PPEEB薄膜之间的差异;用于拟合电流-电压数据的两个可调参数被证明几乎是常数,与n(d) 和温度无关。自由电子密度和电子迁移率通过它们对电场和温度的共同依赖而非线性耦合。数据拟合到一个修正的类普尔-弗伦克尔模型,该模型被证明对有机(激子)半导体中的三个重要电子过程有效:激子效应、掺杂和传输。在室温下,PPEEB薄膜中的电子迁移率估计为0.3 cm²/Vs;理想PPEEB晶体迁移率的拟合值为3.4±2.7 cm²/Vs。描述电流场依赖性的修正普尔-弗伦克尔因子为2±1×10⁻⁴ eV (cm/V)¹/²。对于一个需要一组耦合的非线性张量方程才能精确描述的系统,该分析模型出奇地准确。基于一般的静电考虑,我们的模型可以为处理更复杂的系统奠定必要的基础。提出了一些与诸如π共轭聚合物等偶然掺杂材料的类比。