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通过用空间位阻烷基官能化实现硅(111)表面的化学和电学钝化

Chemical and electrical passivation of silicon (111) surfaces through functionalization with sterically hindered alkyl groups.

作者信息

Nemanick E Joseph, Hurley Patrick T, Brunschwig Bruce S, Lewis Nathan S

机构信息

210 Noyes Laboratory, 127-72, Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125, USA.

出版信息

J Phys Chem B. 2006 Aug 3;110(30):14800-8. doi: 10.1021/jp057070i.

Abstract

Crystalline Si(111) surfaces have been alkylated in a two-step chlorination/alkylation process using sterically bulky alkyl groups such as (CH3)2CH- (iso-propyl), (CH3)3C- (tert-butyl), and C6H5- (phenyl) moieties. X-ray photoelectron spectroscopic (XPS) data in the C 1s region of such surfaces exhibited a low energy emission at 283.9 binding eV, consistent with carbon bonded to Si. The C 1s XPS data indicated that the alkyls were present at lower coverages than methyl groups on CH(3)-terminated Si(111) surfaces. Despite the lower alkyl group coverage, no Cl was detected after alkylation. Functionalization with the bulky alkyl groups effectively inhibited the oxidation of Si(111) surfaces in air and produced low (<100 cm s(-1)) surface recombination velocities. Transmission infrared spectroscopy indicated that the surfaces were partially H-terminated after the functionalization reaction. Application of a reducing potential, -2.5 V vs Ag+/Ag, to Cl-terminated Si(111) electrodes in tetrahydrofuran resulted in the complete elimination of Cl, as measured by XPS. The data are consistent with a mechanism in which the reaction of alkyl Grignard reagents with the Cl-terminated Si(111) surfaces involves electron transfer from the Grignard reagent to the Si, loss of chloride to solution, and subsequent reaction between the resultant silicon radical and alkyl radical to form a silicon-carbon bond. Sites sterically hindered by neighboring alkyl groups abstract a H atom to produce Si-H bonds on the surface.

摘要

晶体硅(111)表面已通过两步氯化/烷基化过程进行烷基化,使用空间位阻较大的烷基,如(CH3)2CH-(异丙基)、(CH3)3C-(叔丁基)和C6H5-(苯基)部分。此类表面C 1s区域的X射线光电子能谱(XPS)数据在283.9结合能电子伏特处显示出低能发射,这与与硅键合的碳一致。C 1s XPS数据表明,与CH(3)封端的Si(111)表面上的甲基相比,烷基的覆盖度较低。尽管烷基覆盖度较低,但烷基化后未检测到氯。用空间位阻较大的烷基进行功能化有效地抑制了Si(111)表面在空气中的氧化,并产生了低(<100 cm s(-1))的表面复合速度。透射红外光谱表明,功能化反应后表面部分被氢封端。在四氢呋喃中对Cl封端的Si(111)电极施加-2.5 V(相对于Ag+/Ag)的还原电位,通过XPS测量发现Cl被完全消除。这些数据与一种机制一致,即烷基格氏试剂与Cl封端的Si(111)表面的反应涉及电子从格氏试剂转移到硅,氯向溶液中损失,以及随后生成的硅自由基与烷基自由基之间反应形成硅-碳键。被相邻烷基空间位阻的位点夺取一个氢原子以在表面产生Si-H键。

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