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幅度调制原子力显微镜的一般理论。

General theory of amplitude-modulation atomic force microscopy.

作者信息

Lee Manhee, Jhe Wonho

机构信息

School of Physics and Astronomy, Seoul National University, Seoul 151-747, Korea.

出版信息

Phys Rev Lett. 2006 Jul 21;97(3):036104. doi: 10.1103/PhysRevLett.97.036104. Epub 2006 Jul 19.

DOI:10.1103/PhysRevLett.97.036104
PMID:16907516
Abstract

We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and phase of the oscillating tip in amplitude-modulation atomic force microscopy (AM-AFM). We apply the method to the known Lennard-Jones-type forces and find excellent agreement with the reconstructed results. AM-AFM, widely used in air and liquid, is now not only an imaging tool but also a quantitative force measurement tool.

摘要

我们提出了一种通用的分析理论,该理论能够根据调幅原子力显微镜(AM-AFM)中振荡探针振幅和相位的实验测量结果,精确确定未知的探针-样品相互作用。我们将该方法应用于已知的 Lennard-Jones 型力,并发现与重建结果高度吻合。AM-AFM 在空气和液体中广泛应用,现在它不仅是一种成像工具,也是一种定量力测量工具。

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