Ishino Masahiko, Heimann Philip A, Sasai Hiroyuki, Hatayama Masatoshi, Takenaka Hisataka, Sano Kazuo, Gullikson Eric M, Koike Masato
Quantum Beam Science Directorate, Japan Atomic Energy Agency, Kizu, Kyoto, Japan.
Appl Opt. 2006 Sep 10;45(26):6741-5. doi: 10.1364/ao.45.006741.
W/C and Co/SiO(2) multilayer gratings have been fabricated by depositing a multilayer coating on the surface of laminar-type holographic master gratings. The diffraction efficiency was measured by reflectometers in the energy region of 0.6-8.0 keV at synchrotron radiation facilities as well as with an x-ray diffractometer at 8.05 keV. The Co/SiO(2) and W/C multilayer gratings showed peak diffraction efficiencies of 0.47 and 0.38 at 6.0 and 8.0 keV, respectively. To our knowledge, the peak efficiency of the W/C multilayer grating is the highest measured with hard x rays. The diffraction efficiency of the Co/SiO(2) multilayer gratings was higher than that of the W/C multilayer grating in the energy range of 2.5-6.0 keV. However, it decreased significantly in the energy above the K absorption edge of Co (7.71 keV). For the Co/SiO(2) multilayer grating, the measured diffraction efficiencies agreed with the calculated curves assuming a rms roughness of approximately 1 nm.
通过在层状全息母光栅表面沉积多层涂层,制备了W/C和Co/SiO₂多层光栅。在同步辐射设施的0.6 - 8.0 keV能量区域以及在8.05 keV下用X射线衍射仪测量了衍射效率。Co/SiO₂和W/C多层光栅在6.0 keV和8.0 keV时的峰值衍射效率分别为0.47和0.38。据我们所知,W/C多层光栅的峰值效率是用硬X射线测量到的最高值。在2.5 - 6.0 keV能量范围内,Co/SiO₂多层光栅的衍射效率高于W/C多层光栅。然而,在高于Co的K吸收边(7.71 keV)的能量下,其衍射效率显著下降。对于Co/SiO₂多层光栅,假设均方根粗糙度约为1 nm时,测量的衍射效率与计算曲线相符。