Liu Zhiguo, Li Zhuang, Wei Gang, Song Yonghai, Wang Li, Sun Lanlan
State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Graduate School of the Chinese Academy of Sciences, Chinese Academy of Sciences, Changchun, China.
Microsc Res Tech. 2006 Dec;69(12):998-1004. doi: 10.1002/jemt.20379.
A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip-sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system.
引入了一种改进的原子力显微镜（AFM）轻敲模式用于操作、解剖和光刻。通过在正常轻敲模式下充分降低AFM针尖的振幅并调整设定点，可以有效控制针尖与样品之间的相互作用。这种改进的轻敲模式具有AFM接触模式的一些特点，可用于操纵纳米颗粒、解剖生物分子以及在各种表面上制作光刻图案。该方法无需任何额外设备，可应用于任何AFM系统。
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