Solares Santiago D
J Phys Chem B. 2007 Mar 8;111(9):2125-9. doi: 10.1021/jp070067+. Epub 2007 Feb 10.
A new intermittent-contact atomic force microscopy (AFM) mode (frequency and force modulation AFM, FFM-AFM) has been recently proposed to characterize soft samples. This method uses excitation force frequency and amplitude modulation to eliminate bistability and reduce the tip-sample forces. This letter describes theoretical modeling of FFM-AFM applied to a single bacteriorhodopsin molecule on a substrate, showing that its cross section can be measured without damage, in contrast to conventional tapping-mode AFM. Speculations are made regarding nonideal conditions and the ability of FFM-AFM to perform quantitative nanoelasticity measurements.
最近提出了一种新的间歇接触原子力显微镜(AFM)模式(频率和力调制AFM,FFM-AFM)来表征软样品。该方法使用激发力频率和幅度调制来消除双稳态并降低针尖-样品力。本文描述了将FFM-AFM应用于基底上单个细菌视紫红质分子的理论建模,表明与传统轻敲模式AFM相比,其横截面可以无损测量。文中还对非理想条件以及FFM-AFM进行定量纳米弹性测量的能力进行了推测。