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基于迹变换的仿射参数估计。

Affine parameter estimation from the trace transform.

作者信息

Kadyrov Alexander, Petrou Maria

机构信息

Electrical and Electronic Engineering Department, Imperial College, London, SW7 2AZ, UK.

出版信息

IEEE Trans Pattern Anal Mach Intell. 2006 Oct;28(10):1631-45. doi: 10.1109/TPAMI.2006.198.

Abstract

In this paper, we assume that we are given the images of two segmented objects, one of which may be an affinely distorted version of the other, and wish to recover the values of the parameters of the affine transformation between the two images. The images may also differ by the overall level of illumination. The multiplicative constant of such difference may also be recovered. We present a generic theoretical framework to solve this problem. In terms of this framework, other proposed methods may be interpreted. We show how, in this framework, one can recover the affine parameters in a way that is robust to various effects, such as occlusion and illumination variation. The proposed method is generic enough to be applicable also to matching two images that do not depict the same scene or object.

摘要

在本文中,我们假设给定了两个分割对象的图像,其中一个可能是另一个的仿射扭曲版本,并希望恢复这两个图像之间仿射变换参数的值。图像在整体光照水平上也可能存在差异。这种差异的乘法常数也可以恢复。我们提出了一个通用的理论框架来解决这个问题。根据这个框架,可以解释其他提出的方法。我们展示了在这个框架中,如何以一种对各种影响(如遮挡和光照变化)具有鲁棒性的方式恢复仿射参数。所提出的方法足够通用,也适用于匹配两个不描绘相同场景或对象的图像。

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