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用于化学气相沉积氮化钨的芳基和烷基亚氨基前驱体的均相分解:密度泛函理论与实验相结合的研究

Homogeneous decomposition of aryl- and alkylimido precursors for the chemical vapor deposition of tungsten nitride: a combined density functional theory and experimental study.

作者信息

Won Yong Sun, Kim Young Seok, Anderson Timothy J, Reitfort Laurel L, Ghiviriga Ion, McElwee-White Lisa

机构信息

Department of Chemical Engineering, University of Florida, Gainesville, Florida 32611-6005, USA.

出版信息

J Am Chem Soc. 2006 Oct 25;128(42):13781-8. doi: 10.1021/ja0621804.

Abstract

MOCVD growth of tungsten nitride (WN(x)()) and tungsten carbonitride (WN(x)()C(y)()) thin films has been reported from the complexes Cl(4)(CH(3)CN)W(NR) (1: R = Ph; 2: R = (i)Pr; 3: R = C(3)H(5)). To evaluate the role of the imido substituent in film growth, gas-phase homogeneous decomposition of precursor molecules was investigated using density functional theory (DFT) calculations. Computational results and NMR kinetics of acetonitrile exchange by 2 in solution verified that dissociation of the acetonitrile ligand should be facile for 1-3 in the temperature range used for film growth (>450 degrees C). A computational search for transition states for cleavage of W-Cl bonds in the presence of H(2) carrier gas was consistent with a sigma-bond metathesis pathway. Natural bonding orbital (NBO) analysis and bond energy calculations indicated that 1 has a stronger N-C(imido) bond and a slightly weaker W-N bond than 2 and 3, suggesting a greater role for W-N bond cleavage in depositions from 1. These results are consistent with mass spectrometric fragmentation patterns from 1-3 and low nitrogen content in films deposited from 1 as compared to those from 2 and 3.

摘要

已有报道称,利用配合物Cl(4)(CH(3)CN)W(NR)(1:R = Ph;2:R = (i)Pr;3:R = C(3)H(5))通过金属有机化学气相沉积法(MOCVD)生长氮化钨(WN(x)())和碳氮化钨(WN(x)()C(y)())薄膜。为了评估亚氨基取代基在薄膜生长中的作用,使用密度泛函理论(DFT)计算研究了前驱体分子的气相均相分解。计算结果以及2在溶液中乙腈交换的核磁共振动力学证实,在用于薄膜生长的温度范围(>450℃)内,对于1 - 3而言,乙腈配体的解离应该很容易。在存在H(2)载气的情况下,对W - Cl键断裂的过渡态进行的计算搜索与σ键复分解途径一致。自然键轨道(NBO)分析和键能计算表明,与2和3相比,1具有更强的N - C(亚氨基)键和稍弱的W - N键,这表明在由1进行的沉积过程中,W - N键断裂起更大的作用。这些结果与1 - 3的质谱碎片化模式以及与2和3相比由1沉积的薄膜中低氮含量一致。

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