Fernández-Perea Mónica, Larruquert Juan I, Aznárez José A, Méndez José A, Poletto Luca, Malvezzi A Marco, Giglia Angelo, Nannarone Stefano
Instituto de Fisica Aplicada-Consejo Superior de Investigaviones Científicas, C/Serrano 144, 28006 Madrid, Spain.
J Opt Soc Am A Opt Image Sci Vis. 2006 Nov;23(11):2880-7. doi: 10.1364/josaa.23.002880.
The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Krönig analysis. Sum-rule tests indicated an acceptable consistency of the data.
在超高真空条件下通过蒸发沉积的钪薄膜的透过率已在20 - 1000 eV光谱范围内进行了研究。透过率测量是在沉积在涂有碳支撑膜的网格上的钪层上原位进行的。透过率测量用于获得在所研究的每个单独光子能量下钪薄膜的消光系数。这些数据,连同文献中其余光谱的数据,通过克莱默斯 - 克勒尼希分析用于获得钪的折射率。求和规则测试表明数据具有可接受的一致性。