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Structural contributions to charge transport across Ni-octanedithiol multilayer junctions.

作者信息

Yu Lam H, Zangmeister Christopher D, Kushmerick James G

机构信息

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

出版信息

Nano Lett. 2006 Nov;6(11):2515-9. doi: 10.1021/nl061867j.

Abstract

We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominated by the intrinsic properties of the multilayer.

摘要

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