Kelly Damien P, Ward Jennifer E, Gopinathan Unnikrishnan, Hennelly Bryan M, O'Neill Feidhlim T, Sheridan John T
School of Electrical, Electronic and Mechanical Engineering, University College Dublin, Dublin, Ireland.
Opt Lett. 2006 Dec 1;31(23):3444-6. doi: 10.1364/ol.31.003444.
In speckle-based metrology systems, a finite range of possible motion or deformation can be measured. When coherent imaging systems with a single limiting aperture are used in speckle metrology, the observed decorrelation effects that ultimately define this range are described by the well-known Yamaguchi correlation factor. We extend this result to all coherent quadratic phase paraxial optical systems with a single aperture and provide experimental results to support our theoretical conclusions.
在基于散斑的计量系统中，可以测量有限范围的可能运动或变形。当在散斑计量中使用具有单个限制孔径的相干成像系统时，最终定义此范围的观察到的去相关效应由著名的山口相关因子描述。我们将这一结果扩展到所有具有单个孔径的相干二次相位傍轴光学系统，并提供实验结果以支持我们的理论结论。
