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通过傅里叶变换红外映射显微镜和光学轮廓测量研究分析铜的腐蚀表面粗糙度。

Corroded surface roughness of copper analyzed by Fourier transform infrared mapping microscopy and optical profilometric study.

作者信息

Kasperek J, Lefez B, Beucher E

机构信息

Institut des materiaux, LASTSM, Université de Rouen, UPRES-EA 1290, 76801 Saint Etienne du Rouvray cedex, France.

出版信息

Appl Spectrosc. 2004 Feb;58(2):179-83. doi: 10.1366/000370204322842904.

Abstract

This study shows the effects of roughness on infrared spectra shapes of thin corrosion products on metallic substrates. The calculated spectra show that the baseline is mainly affected by increasing roughness and that such effects do not shift the position of the absorption bands. The model obtained has been used to extract data of artificial patina on a copper surface. Surface defects of copper substrates can be distinguished on the whole surface, from the morphological and chemical points of view, using optical profilometry and infrared microspectroscopy. An homogeneous layer of cuprite covers the surface except in the linear defects. Fourier transform infrared (FT-IR) analysis indicates that a mixture of atacamite and clinoatacamite is mainly located in these scratches. The width of these particular areas is in good agreement with profilometric observations.

摘要

本研究展示了粗糙度对金属基底上薄腐蚀产物红外光谱形状的影响。计算得到的光谱表明,基线主要受粗糙度增加的影响,且这种影响不会使吸收带的位置发生偏移。所获得的模型已用于提取铜表面人工铜绿的数据。从形态学和化学角度来看,利用光学轮廓仪和红外显微光谱法可以在整个铜基底表面区分出表面缺陷。除了线性缺陷区域外,表面覆盖着一层均匀的赤铜矿。傅里叶变换红外(FT - IR)分析表明,氯铜矿和斜氯铜矿的混合物主要位于这些划痕中。这些特定区域的宽度与轮廓测量结果吻合良好。

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