Cohen Hagai, Sarkar Shaibal K, Hodes Gary
Department of Chemical Research Support, The Weizmann Institute of Science, Rehovot 76100, Israel.
J Phys Chem B. 2006 Dec 21;110(50):25508-13. doi: 10.1021/jp0648590.
Light-induced chemically resolved electrical measurements (CREM) under controlled electrical conditions are used to study photovoltaic effects at selected regions in nanocrystalline CdSe-based films. The method, based on X-ray photoelectron spectroscopy (XPS), possesses unique capabilities for exploring charge trapping and charge transport mechanisms, combining spectrally filtered input signals with photocurrent detection and with a powerful, site-selective, photovoltage probe.
在可控电学条件下进行的光诱导化学分辨电学测量（CREM）被用于研究基于纳米晶CdSe薄膜中选定区域的光伏效应。该方法基于X射线光电子能谱（XPS），结合了光谱滤波输入信号、光电流检测以及强大的、位点选择性的光电压探针，在探索电荷俘获和电荷传输机制方面具有独特的能力。
