表面化学分析工具在纳米颗粒表征中的应用。
Application of surface chemical analysis tools for characterization of nanoparticles.
机构信息
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352, USA.
出版信息
Anal Bioanal Chem. 2010 Feb;396(3):983-1002. doi: 10.1007/s00216-009-3360-1. Epub 2010 Jan 6.
Abstract
The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties.
摘要
描述了表面化学分析方法在纳米粒子特性描述中能够且应当发挥的重要作用。简要总结了利用俄歇电子能谱（AES）、X 射线光电子能谱（XPS）、飞行时间二次离子质谱（TOF-SIMS）、低能离子散射（LEIS）和扫描探针显微镜（SPM），包括扫描隧道显微镜（STM）和原子力显微镜（AFM），对纳米粒子进行分析可以获得的信息类型。提供了描述工程纳米粒子特性的实例。讨论并总结了使用表面分析方法对纳米粒子进行特性描述时的具体分析注意事项和相关问题，以及形状不稳定性、环境诱导变化、有意和无意的涂层等对纳米粒子性质的影响。
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