Huang M, Niu X, Soboyejo W O
Silicon Technology Development, Texas Instruments Inc., 13560 North Central Expressway, MS 3735, Dallas, TX 75243, USA.
J Mater Sci Mater Med. 2007 Jan;18(1):65-9. doi: 10.1007/s10856-006-0663-z.
This paper considers foundation and epoxy creep induced loading rate effects on radial cracks in multilayered structures. These include top layers of glass or silicon that are bonded to polycarbonate foundations with epoxy. The creep properties of the epoxy join and the polycarbonate foundation are determined using compression experiments and spring-dashpot models. The measured creep parameters are then incorporated into an analytical mechanics model, and finite element simulations are used to predict the effects of creep on the critical loads for radial cracking at different loading rates. The models suggest that the combined effects of creep and slow crack growth must be considered in the predictions of the critical loads required for radial cracking in the systems containing glass top layers. Since slow crack growth does not occur in silicon, the model considering the creep effect is used to predict the critical loads for radial cracking in the systems containing silicon top layers. In both of the structures, analytical solutions are obtained for bi-layer structures and finite element simulations are used for tri-layer structures. Our results show that the analytical solutions obtained by bi-layer structures provide good estimations for tri-layer structures when the epoxy thickness is less than 100 mum. The predictions obtained for both systems are shown to provide improved predictions by comparing with experimental results reported by Lee et al. [J. Am. Ceram. Soc., 2002, 85(8), 2019-2024]. In both systems, the modeling of join/substrate creep is shown to be important for the accurate prediction of loading rate effects on radial cracking.
本文考虑了基础和环氧树脂蠕变引起的加载速率对多层结构径向裂纹的影响。这些多层结构包括用环氧树脂粘结到聚碳酸酯基础上的玻璃或硅顶层。通过压缩实验和弹簧-阻尼器模型来确定环氧树脂接头和聚碳酸酯基础的蠕变特性。然后将测量得到的蠕变参数纳入解析力学模型,并使用有限元模拟来预测蠕变对不同加载速率下径向开裂临界载荷的影响。模型表明,在预测含有玻璃顶层的系统中径向开裂所需的临界载荷时,必须考虑蠕变和慢裂纹扩展的综合影响。由于硅中不会发生慢裂纹扩展,因此使用考虑蠕变效应的模型来预测含有硅顶层的系统中径向开裂的临界载荷。在这两种结构中,对于双层结构获得了解析解,对于三层结构则使用了有限元模拟。我们的结果表明,当环氧树脂厚度小于100μm时,双层结构得到的解析解能为三层结构提供良好的估计。通过与Lee等人[《美国陶瓷学会杂志》,2002年,85(8),2019 - 2024]报道的实验结果进行比较,结果表明这两种系统的预测都得到了改进。在这两种系统中,接头/基体蠕变的建模对于准确预测加载速率对径向开裂的影响都很重要。