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超越瑞利判据:光栅辅助远场光学衍射层析成像

Beyond the Rayleigh criterion: grating assisted far-field optical diffraction tomography.

作者信息

Sentenac Anne, Chaumet Patrick C, Belkebir Kamal

机构信息

Institut Fresnel (UMR 6133), Université Paul Cézanne and Université de Provence, F-13397 Marseille Cedex 20, France.

出版信息

Phys Rev Lett. 2006 Dec 15;97(24):243901. doi: 10.1103/PhysRevLett.97.243901. Epub 2006 Dec 11.

DOI:10.1103/PhysRevLett.97.243901
PMID:17280284
Abstract

We propose an optical imaging system, in which both illumination and collection are done in far field, that presents a power of resolution better than one-tenth of the wavelength. This is achieved by depositing the sample on a periodically nanostructured substrate illuminated under various angles of incidence. The superresolution is due to the high spatial frequencies of the field illuminating the sample and to the use of an inversion algorithm for reconstructing the map of relative permittivity from the diffracted far field. Thus, we are able to obtain wide-field images with near-field resolution without scanning a probe in the vicinity of the sample.

摘要

我们提出了一种光学成像系统,其照明和采集均在远场进行,该系统具有优于十分之一波长的分辨率。这是通过将样品沉积在周期性纳米结构的衬底上实现的,该衬底在不同入射角下被照亮。超分辨率归因于照亮样品的场的高空间频率以及使用反演算法从衍射远场重建相对介电常数图。因此,我们能够在不扫描样品附近探针的情况下获得具有近场分辨率的宽场图像。

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